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전체선택

Demonstration and STEM Analysis of Ferroelectric Switching in MOCVD-Grown Single Crystalline Al$_{0.85}$Sc$_{0.15}$N

보고서

issue: Adv. Physics Res. 2024, 2300113
Author: Wolff, Niklas
Schoenweger, Georg
Streicher, Isabel
Islam, Md Redwanul
Braun, Nils
Stranak, Patrik
Kirste, Lutz
Prescher, Mario
Lotnyk, Andriy
Kohlstedt, Hermann
Leone, Stefano
Kienle, Lorenz
Fichtner, Simon
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Potassium Tantalate-Niobate for Electro-Optically Driven Adiabatic Frequency Conversion

회의자료

issue: 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2023 Conference on. :1-1 Jun, 2023
Author: Mrokon, Alexander
Kirste, Lutz
Buse, Karsten
Breunig, Ingo
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) Full Text (OSA)

Coalescence as a key process in wafer-scale diamond heteroepitaxy.

학술저널

issue: Journal of Applied Physics; 4/14/2024, Vol. 135 Issue 14, p1-13, 13p
Author: Lebedev, Vadim
Kustermann, Jan
Engels, Jan
Weippert, Jürgen
Cimalla, Volker
Knittel, Peter
Kirste, Lutz
Giese, Christian
Quellmalz, Patricia
Graff, Andreas
Jeske, Jan
DB Label: Database : Complementary Index

원문보기: Full Text (AIP) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Non-Polar a-plane AlScN($11\overline{2}0$) Thin Film Based SAW Resonators with Significantly Improved Electromechanical Coupling

회의자료

issue: 2020 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS),2020 IEEE International. :1-4 Sep, 2020
Author: Ding, Anli
Driad, Rachid
Lu, Yuan
Feil, Niclas M.
Kirste, Lutz
Christoph, Tim
Ambacher, Oliver
Zukauskaite, Agne
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

In-Plane Oriented Stacks of c-AlScN/Mo (110) for BAW Resonators Grown by Magnetron Sputter Epitaxy

회의자료

issue: 2020 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS),2020 IEEE International. :1-4 Sep, 2020
Author: Sundarapandian, Balasubramanian
Kessel, Maximilian
Zukauskaite, Agne
Kirste, Lutz
Sun, Cheng
Ambacher, Oliver
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

An advanced Bragg diffraction imaging technique to characterize defects in SiC and GaN : Topic/category, e.g. AM: Advanced Metrology

회의자료

issue: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-2 May, 2022
Author: Tran Thi Caliste, Thu Nhi
Kirste, Lutz
Drouin, Alexis
Baruchel, Jose
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Experimental determination of Al1-xScxN thin film thermo-electro-acoustic properties up to 140°C by using SAW resonators

회의자료

issue: 2019 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2019 IEEE International. :710-715 Oct, 2019
Author: Ding, Anli
Kurz, Nicolas
Driad, Rachid
Lu, Yuan
Lozar, Roger
Christoph, Tim
Kirste, Lutz
Ambacher, Oliver
Zukauskaite, Agne
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Determination of Elastic and Piezoelectric Properties of Al0.84Sc0.16N Thin Films

회의자료

issue: 2018 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2018 IEEE International. :1-5 Oct, 2018
Author: Kurz, Nicolas
Parsapour, Fazel
Pashchenko, Vladimir
Kirste, Lutz
Lebedev, Vadim
Muralt, Paul
Ambacher, Oliver
Pascal, Nicolay
DB Label: Database : IEEE Xplore Digital Library