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전체선택

High current characteristics of devices in a 0.18 /spl mu/m CMOS technology

회의자료

issue: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :296-307 2000
Author: Worley, E.
Salem, A.
Sittampalam, Y.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

회의자료

issue: Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999. :212-224 1999
Author: Voldman, S.
Anderson, W.
Ashton, R.
Chaine, M.
Duvvury, C.
Maloney, T.
Worley, E.
DB Label: Database : IEEE Xplore Digital Library

원문보기

Electrostatic discharge (ESD) technology benchmarking strategy for evaluating ESD robustness of CMOS technologies

회의자료

issue: 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) Integrated reliability workshop Integrated Reliability Workshop Final Report, 1998. IEEE International. :72-77 1998
Author: Voldman, S.
Anderson, W.
Ashton, R.
Chaine, M.
Duvvury, C.
Maloney, T.
Worley, E.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Improved performance and reliability of split gate source-side injected flash memory cells

회의자료

issue: International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :339-342 1996
Author: Bhattacharya, S.
Lai, K.
Fox, K.
Chan, P.
Worley, E.
Sharma, U.
Liming Hwang
Li, G.P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Electrostatic Discharge - ESD

회의자료

issue: 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) Integrated reliability workshop Integrated Reliability Workshop Final Report, 1998. IEEE International. :94-96 1998
Author: Gieser, H.
Worley, E.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Experimental and simulation study of the effects of cosmic particles on CMOS/SOS RAMs

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 37(6):1855-1860 Dec, 1990
Author: Worley, E.
Williams, R.
Waskiewicz, A.
Groninger, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 원문복사신청 - FRIC

The gate bias and geometry dependence of random telegraph signal amplitudes [MOSFET]

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 18(9):444-446 Sep, 1997
Author: Martin, S.T.
Li, G.P.
Worley, E.
White, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 원문복사신청 - FRIC

Consideration of low-frequency noise in MOSFETs for analog performance

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 17(12):552-554 Dec, 1996
Author: Chun Hu
Li, G.P.
Worley, E.
White, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 원문복사신청 - FRIC

The effects of plasma etching induced gate oxide degradation on MOSFET's 1/f noise

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 16(2):61-63 Feb, 1995
Author: Chun Hu
Ji Zhao
Li, G.P.
Liu, P.
Worley, E.
White, J.
Kjar, R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 원문복사신청 - FRIC

Modeling the bias and scaling dependence of drain current fluctuations due to single carrier trapping in submicron MOSFET's

회의자료

issue: 1996 54th Annual Device Research Conference Digest Device research Device Research Conference, 1996. Digest. 54th Annual. :116-117 1996
Author: Martin, S.T.
Li, G.P.
Worley, E.
White, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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