자료유형 | 연속간행물 |
---|---|
서명/저자사항 | IEEE design & test of computers / IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc. |
단체저자명 | IEEE Computer Society. Institute of Electrical and Electronics Engineers. |
권.연차 사항 | Vol. 1, no. 1 (Feb. 1984)- |
발행사항 | Los Alamitos, CA: IEEE Computer Society, c1984-. |
형태사항 | v: ill; 28cm. |
간행빈도 | Quarterly, Mar. 1991- |
이전간행빈도 | Quarterly, Feb. 1984- Bimonthly, <Oct. 1987>-Dec. 1990 |
축약표제 | IEEE des. test comput. |
등록표제 | IEEE design & test of computers. |
부분표제 | IEEE design and test of computers. Design & test of computers. Design and test of computers. IEEE design and test. |
난외표제 | IEEE design & test. |
ISSN | 0740-7475 |
일반주기 |
Title from cover.
|
색인/초록 수록지 | Index to IEEE publications, 0099-1368 Electronics and communications abstracts journal (Riverdale), 0361-3313 International aerospace abstracts, 0020-5842, 1984- ISMEC bulletin, 0306-0039 Pollution abstracts with indexes, 0032-3624 Safety science abstracts journal, 0160-1342 |
이용가능한 다른형태자료 | Available also on microfilm and microfiche from the Institute of Electrical and Electronics Engineers. |
일반주제명 | Computer engineering -- Periodicals. Electronic digital computers -- Testing -- Periodicals. |
분류기호(DDC) | 621.38 |
언어 | 영어 |
보존/밀집/기증 자료 신청
No. | 소장처 | 소장사항 | 청구기호 | 구독 | 최근입수호 | 권호·제본정보 보기 |
---|---|---|---|---|---|---|
1 | 중앙도서관[본관]/4자료실(4층)/ | 621.38 I22idt | 구독중단 | v.17 n.4 | ||
2 | 중앙도서관[본관]/5자료실(4층)/ | 621.38 I22idt | ||||
3 | 중앙도서관[본관]/보존논문실(5층)/ | 621.38 I22idt |